System-Level Testing of Embedded Analogue Cores in SoC
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منابع مشابه
Analogue Core-Based Test-Pattern Generation*
– Core-based testing, which is described by the proposed IEEE standard P1500, is an effective test method for Systems-on-Chip (SOC) containing embedded cores. This test method is usable for all classes of digital cores and provides solutions that allow automatic identification and configuration of testability features in SOC containing embedded cores. In this moment, IEEE P1500 is restricted to...
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تاریخ انتشار 2003